Hot carrier effects in short MOSFETs at low applied voltages

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 301-304

  Abramo, Antonio ^a   Fiegna, Claudio ^a   Venturi, Franco ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; BOUNDARY CONDITIONS; CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRIC HEATING; ELECTROMAGNETIC WAVE SCATTERING; ELECTRON SCATTERING; HOT CARRIERS; MONTE CARLO METHODS;

ELECTRON ENERGY DISTRIBUTION; ELECTRON-ELECTRON INTERACTION; HIGH ENERGY ELECTRON POPULATION; LOW APPLIED VOLTAGES; VOLTAGE DROP;

MOSFET DEVICES;

EID: 0029489166     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)