Modeling the heavy ion cross-section for single event upset with track structure effects: The HIC-UP-TS model

IEEE Transactions on Nuclear Science

Volumn 43, Issue 6 PART 1, 1996, Pages 2814-2819

  Connell, L W ^a   Sexton, F W ^a   McDaniel, P J ^b   Prinja, A K ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Phillips Laboratories   (United States)

^c UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRONS; ION BEAMS; MATHEMATICAL MODELS;

HEAVY ION CROSS SECTION; SINGLE EVENT UPSETS;

RADIATION EFFECTS;

EID: 0030364983     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.556871     Document Type: Article

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