Test resource partitioning and reduced pin-count testing based on test data compression

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2002, Pages 598-603

  Chandra, Anshuman ^a   Chakrabarty, Krishnendu ^a  

^a USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY SCAN; DEFECT COVERAGE; EMBEDDED CORES; RUN-LENGTH CODE; SYSTEM-ON-A-CHIP; TEST DATA COMPRESSION; TEST RESOURCE PARTITIONING; TEST-DATA VOLUME;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; EXHIBITIONS;

INTEGRATED CIRCUIT TESTING;

EID: 0011840592     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2002.998362     Document Type: Conference Paper

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