The influence of the photoelectron elastic scattering on the photoelectron diffraction patterns, in-depth profiling and thin film thickness determination

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 509-516

  Nefedov, V I ^a   Fedorova, I S ^a  

^a KURNAKOV INSTITUTE OF GENERAL AND INORGANIC CHEMISTRY   (Russian Federation)

Author keywords

Elastic scattering; Thin film thickness

Indexed keywords

EID: 0004605871     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00116-3     Document Type: Article

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