Cu Electroplating on H-Terminated n-Si(111) Properties and Structure of n-Si/Cu Junctions

Journal of the Electrochemical Society

Volumn 148, Issue 9, 2001, Pages

  Zambelli, T ^a   Munford, M L ^b   Pillier, F ^a   Bernard, M C ^a   Allongue, P ^a  

^a Université Pierre et Marie Curie   (France)

^b FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000735353     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1387238     Document Type: Article

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