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Volumn 147, Issue 3, 2000, Pages 1026-1030

Charge exchange processes during the open-circuit deposition of nickel on silicon from fluoride solutions

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; DISSOLUTION; ELECTROCHEMICAL ELECTRODES; ELECTRODEPOSITION; ION EXCHANGE; PH EFFECTS; SCANNING TUNNELING MICROSCOPY; SILICON;

EID: 0343061052     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1393308     Document Type: Article
Times cited : (95)

References (34)
  • 5
    • 0003661114 scopus 로고
    • A. A. Gewirth and H. Siegenthaler, Editors, Kluwer Academic Publishers, Amsterdam
    • P. Allongue, in Nanoscale Probes of the Solid/Liquid Interface, A. A. Gewirth and H. Siegenthaler, Editors, Kluwer Academic Publishers, Amsterdam (1995).
    • (1995) Nanoscale Probes of the Solid/liquid Interface
    • Allongue, P.1
  • 12
    • 0342963583 scopus 로고
    • Ph.D. Thesis, Université Paris VI. France
    • C. Dennig, Ph.D. Thesis, Université Paris VI. France (1991).
    • (1991)
    • Dennig, C.1
  • 15
    • 0343398907 scopus 로고    scopus 로고
    • U.S. Pat. 3,857,733 (1974)
    • See, for example, A. F. Arnold, U.S. Pat. 3,857,733 (1974); C. H. Ting, M. Paunovic, P. L. Pai, and G. Chiu, J. Elecrohem. Soc., 136, 462 (1989).
    • Arnold, A.F.1
  • 19
    • 0002692242 scopus 로고
    • F. A. Lowenheim, Editor, John Wiley & Sons, Inc., New York
    • F. Pearlstein, in Modern Electroplating, F. A. Lowenheim, Editor, p. 710, John Wiley & Sons, Inc., New York (1974).
    • (1974) Modern Electroplating , pp. 710
    • Pearlstein, F.1
  • 21


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.