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Volumn 1, Issue 5, 1996, Pages 645-652

Surface structure reflectometry with X-rays

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[No Author keywords available]

Indexed keywords


EID: 0000179988     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(96)80046-5     Document Type: Article
Times cited : (17)

References (98)
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