X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth

Journal of Applied Physics

Volumn 79, Issue 9, 1996, Pages 6858-6864

  Hong, Hawoong ^a   Aburano, R D ^a   Chung, Ki Sup ^a   Lin, D S ^a,b   Hirschorn, E S ^a   Chiang, T C ^a   Chen, Haydn ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0542446388     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361507     Document Type: Article

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