Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 416-419

  Ohkawa, T ^a   Yamaguchi, Y ^a   Sakata, O ^a   Sanyal, M K ^b   Datta, A ^b   Banerjee, S ^b   Hashizume, H ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; CARRIER CONCENTRATION; INTERFACES (MATERIALS); METALLIC FILMS; REFRACTIVE INDEX; SEMICONDUCTING GERMANIUM; SUBSTRATES; X RAY ANALYSIS;

ANOMALOUS DISPERSION SPECULAR X RAY REFLECTIVITY;

METALLIC SUPERLATTICES;

EID: 0030563093     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00960-4     Document Type: Article

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