Determination of the morphology of deposited islands by grazing-incidence small-angle scattering

Surface and Coatings Technology

Volumn 79, Issue 1-3, 1996, Pages 103-107

  Naudon, André ^a,b   Thiaudière, Dominique ^a,b  

^a UNIVERSITÉ DE POITIERS   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Clusters; Grazing incidence; Small angle; X ray scattering

Indexed keywords

ANISOTROPY; CARBON; FILM GROWTH; GOLD; IMAGE RECORDING; MORPHOLOGY; SCATTERING; SILICON WAFERS; SYNCHROTRONS;

DEPOSITED GOLD ISLANDS; GRAZING INCIDENCE SMALL ANGLE X RAY SCATTERING; IMAGE PLATES; VOLMER-WEBER MECHANISM;

METALLIC FILMS;

EID: 0030083668     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/0257-8972(95)02451-4     Document Type: Article

References (17)

1. A. Naudon, T. Slimani and P. Goudeau, J. Appl. Crystallogr., 24 (1991) 501.
2. J.R. Levine, J.B, Cohen, Y.W. Chung and P. Georgopoulos, J. Appl. Crystallogr., 22 (1989) 528. J.R, Levine, Ph.D. Thesis, Northwestern University, 1990.
3. A. Naudon, D. Thiaudière, J.Ch. Arnault, J. Delafond and C. Templier, C. R. Acad. Sci. Paris, 317 (1993) 1275.
4. J.Ch. Arnault, J. Delafond, C. Templier, J. Chaumont and O. Enea, Nucl. Instrum. Methods B., 80-81 (1993) 1384.
5. S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 35 (1988) 2297. L. Nevot and P. Groce, Rev. Phys. Appl., 15 (1980) 761. J. Daillant and O. Belorgey, J. Chem. Phys., 97 (1992) 5824, 5837. W. Weber and B. Langeler, Phys. Rev. B, 46 (1992) 7953.
6. S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 35 (1988) 2297. L. Nevot and P. Groce, Rev. Phys. Appl., 15 (1980) 761. J. Daillant and O. Belorgey, J. Chem. Phys., 97 (1992) 5824, 5837. W. Weber and B. Langeler, Phys. Rev. B, 46 (1992) 7953.
7. S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 35 (1988) 2297. L. Nevot and P. Groce, Rev. Phys. Appl., 15 (1980) 761. J. Daillant and O. Belorgey, J. Chem. Phys., 97 (1992) 5824, 5837. W. Weber and B. Langeler, Phys. Rev. B, 46 (1992) 7953.
8. S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B, 35 (1988) 2297. L. Nevot and P. Groce, Rev. Phys. Appl., 15 (1980) 761. J. Daillant and O. Belorgey, J. Chem. Phys., 97 (1992) 5824, 5837. W. Weber and B. Langeler, Phys. Rev. B, 46 (1992) 7953.
9. M. Jaulin, G. Laplanche, J. Delafond and S. Pimbert, Surf. Coat. Technol., 37 (1989) 225.
10. J.M. Dubuisson, J.M. Dauvergne, C. Depautex, P. Vachette and C.E. Williams, Nucl. Instrum. Methods A, 246 (1986) 636.
11. B. Baur and V. Gerold, Acta Metall., 10 (1962) 637.
12. A. Naudon and J. Caisso, J. Appl. Crystallogr., 7 (1974) 25.
13. J.L. Pouchou, Anal. Chim. Acta, 283 (1993) 81.
14. A. Naudon, J. Chihab, P. Goudeau and J. Mimault, J. Appl. Crystallogr., 22 (1989) 460.
15. L. Nevot and P. Groce, Rev. Phys. Appl., 15 (1980) 76.
16. J.C. Arnault, C. Templier, J. Delafond, S. Bouffard and H. Garem, Surf. Coat. Technol., 71 (1995) 45.
17. P. Goudeau, A. Naudon, A. Fontaine and C.E. Williams, J. Appl. Crystallogr., 19 (1986) 19.