Interface roughness of InAs/AlSb superlattices investigated by x-ray scattering

Journal of Applied Physics

Volumn 79, Issue 1, 1996, Pages 120-124

  Jenichen, B ^a   Stepanov, S A ^b   Brar, B ^c   Kroemer, H ^c  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b MPG AG Rontgenbeugung   (Germany)

^c University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001619639     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360918     Document Type: Article

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