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Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 3, 1996, Pages 1398-1412

Interface structure of MBE-grown/Si layers on Si(111): Partially correlated roughness and diffuse x-ray scattering

(7) Stettner, J a Schwalowsky, L a Seeck, O a Tolan, M a Press, W a Schwarz, C b Kanel H b

a UNIVERSITY OF KIEL (Germany)

b ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001063850 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.53.1398 Document Type: Article

Times cited : (54)

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