Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterization

Journal of Microscopy

Volumn 209, Issue 3, 2003, Pages 155-161

  Blaize, S ^a   Aubert, S ^a   Bruyant, A ^a   Bachelot, R ^a   Lerondel, G ^a   Royer, P ^a   Broquin, J E ^b   Minier, V ^c  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^b IMEP LAHC   (France)

^c Groupement d'Electromagnetisme   (France)

Author keywords

Apertureless SNOM waveguide characterization; Ion exchange; Scanning microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS SUBSTRATES; INTERFEROMETRY; IONS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; SILICATES; WAVEGUIDES;

AG +; APERTURELESS SCANNING; APERTURELESS SNOM; APERTURELESS SNOM WAVEGUIDE CHARACTERIZATION; CHANNEL WAVEGUIDE; ION-EXCHANGE WAVEGUIDES; NA+ IONS; SCANNING MICROSCOPY; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; WAVEGUIDE CHARACTERIZATION;

ION EXCHANGE;

GLASS; SILICATE; SILVER; SODIUM ION;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE DISPLAY; INTERFEROMETRY; ION EXCHANGE; MICROSCOPE; PHYSICAL PARAMETERS; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SPIKE WAVE; TOPOGRAPHY;

EID: 0037356495     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01106.x     Document Type: Article

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