Quantitative amplitude and phase measurement by use of a heterodyne scanning near-field optical microscope

Optics Letters

Volumn 26, Issue 4, 2001, Pages 208-210

  Nesci, Antonello ^a   Dändliker, René ^a   Herzig, Hans Peter ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EVANESCENT WAVES;

HETERODYNING; INTERFEROMETRY; PHOTONS; SCANNING; SCANNING TUNNELING MICROSCOPY;

PHASE MEASUREMENT;

EID: 0001158717     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.26.000208     Document Type: Article

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