An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation

Applied Physics Letters

Volumn 73, Issue 23, 1998, Pages 3333-3335

  Bachelot, R ^a   Wurtz, G ^a   Royer, P ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; HETEROJUNCTIONS; LASER MODES; OPTICAL FIBERS; OPTICAL MICROSCOPY; PHOTONS; REFRACTIVE INDEX; SCANNING; SEMICONDUCTING GALLIUM COMPOUNDS; SPONTANEOUS EMISSION; THERMAL EFFECTS; TUNGSTEN;

APERTURELESS SCANNING NEARFIELD OPTICAL MICROSCOPY; FORCE PROBE; OPTICAL PROBE; SHARP METALLIC TIP;

SEMICONDUCTOR LASERS;

EID: 0032494913     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122760     Document Type: Article

References (12)

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