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Volumn 108-109, Issue , 2005, Pages 109-114

Electrical properties of clustered and precipitated iron in silicon

Author keywords

DLTS; Extended defects; Iron; Silicon; Suicide precipitates

Indexed keywords

ANNEALING; DEFECTS; ELECTRIC PROPERTIES; IRON; PRECIPITATES; TRANSIENT ANALYSIS;

EID: 85088715893     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-13-2.109     Document Type: Conference Paper
Times cited : (2)

References (21)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.