Traps at the SiC/SiO2-interface

Materials Research Society Symposium-Proceedings

Volumn 640, Issue , 2001, Pages H.3.2.1-H.3.2.11

  Pensl, Gerhard ^a   Bassler, Michael ^a   Ciobanu, Florin ^a   Afanas'ev, Valeri ^b   Yano, Hiroshi ^c   Kimoto, Tsunenobu ^c   Matsunami, Hiroyuki ^c  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85009914862     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (24)