Characterization of individual threading dislocations in GaN using ballistic electron emission microscopy

Physical Review Letters

Volumn 87, Issue 10, 2001, Pages 106802/1-106802/4

  Im, H J ^a   Ding, Y ^a   Pelz, J P ^a   Heying, B ^b   Speck, J S ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b University of California   (United States)

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EID: 84988768655     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/physrevlett.87.106802     Document Type: Article

References (20)