ENVM Technologies Scaling Outlook and Emerging NVM Technologies for Embedded Applications

2016 IEEE 8th International Memory Workshop, IMW 2016

Volumn , Issue , 2016, Pages

  Do, Nhan ^a  

^a MICROCHIP TECHNOLOGY INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL STORAGE;

EMBEDDED APPLICATION; FLOATING GATES; MEMORY CELL; NON-VOLATILE MEMORY; PERFORMANCE AND RELIABILITIES; PROCESS NODES;

DATA STORAGE EQUIPMENT;

EID: 84984603031     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMW.2016.7495269     Document Type: Conference Paper

References (12)

1. Y. Taito et al., "A 28nm Embedded SG-MONOS Flash Macro for Automotive Achieving 200MHz Read Operation and 2.0MB/s Write Throughput at Tj of 170oC," IEEE International Solid-State Circuits Conference, 2015, p. 132.
2. N. Do, "Scaling and Demonstration of a 40nm logic-process-compatible Split-Gate Flash Memory Array," Leading Edge Embedded Non Volatile Memories, 2015.
3. D. Shum et al., "Highly Reliable Flash Memory with Self-aligned Split-gate Cell Embedded into High Performance 65nm CMOS for Automotive & Smartcard Applications," IMW 2012, pp.139-142, 2012.
4. A. Baiano et al., "Junction optimization for embedded 40nm FN/FN Flash memory," IMW 2015, pp.173-176
5. S. T. Kang et al., "High Performance Nanocrystal Based Embedded Flash Microcontrollers with Exceptional Endurance and Nanocrystal Scaling Capability," IMW 2012, pp. 131-134
6. C. Y-S. Cho et al. "A 55-nm, 0.86-Volt operation, 125MHz high speed, 75uA/MHz low power, wide voltage supply range 2M-bit split-gate embedded Flash," IMW 2013, pp. 124-127.
7. N. Do et al.," A 55 nm Logic-Process-Compatible, Split-Gate Flash Memory Array Fully Demonstrated at Automotive Temperature with High Access Speed and Reliability," IMW 2015, pp. 45-48
8. L.Q. Luo et al.," Functionality Demonstration of a High-Density 2.5V Self-Aligned Split-Gate NVM Cell Embedded Into 40nm CMOS Logic Process for Automotive Microcontrollers," IMW 2016.
9. S. Fujita et al., "Technology trends and near future applications of embedded STT-MRAM," IMW 2015, pp. 17-21
10. R. Bez et al., "Phase Change Memory Have Taken the Field," IMW 2013, pp. 13-16
11. R. Yasuhara et al., "Consideration of Conductive Filament for Realization of Low-current and Highly-reliable TaOx ReRAM," IMW 2013, pp. 34-37
12. E. Vianello et al.," Resistive Memories for Ultra-Low-Power embedded computing design," IEDM 2014, pp. 144-147