High performance nanocrystal based embedded flash microcontrollers with exceptional endurance and nanocrystal scaling capability

2012 4th IEEE International Memory Workshop, IMW 2012

Volumn , Issue , 2012, Pages

  Kang, Sung Taeg ^a   Winstead, B ^a   Yater, J ^a   Suhail, M ^a   Zhang, G ^a   Hong, C M ^a   Gasquet, H ^a   Kolar, D ^a   Shen, J ^a   Min, B ^a   Loiko, K ^a   Hardell, A ^a   Le Lepore, E ^a   Parks, R ^a   Syzdek, R ^a   Williams, S ^a   Malloch, W ^a   Chindalore, G ^a   Chen, Y ^b   Shao, Y ^b   Huajun, L ^b   Louis, L ^b   Chaw, S ^b   more..

^a FREESCALE SEMICONDUCTOR INC   (United States)

^b GLOBALFOUNDRIES SINGAPORE PTE LTD   (Singapore)

Author keywords

Data Retention; Embedded Flash; Endurance; Flash Memories; Microncontrollers; Nanocrystal; Scalability

Indexed keywords

AUTOMOTIVE MARKETS; CYCLING PERFORMANCE; DATA RETENTION; DATA UPDATE; EMBEDDED FLASH; EMBEDDED MICROCONTROLLER; MICRONCONTROLLERS; NANOCRYSTAL FLASH MEMORY; PROGRAM/ERASE; SCALING CAPABILITY; SILICON NANOCRYSTAL MEMORY;

DEGRADATION; FLASH MEMORY; MICROCONTROLLERS; NANOCRYSTALS; SCALABILITY; SEMICONDUCTOR STORAGE;

DURABILITY;

EID: 84864114809     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMW.2012.6213668     Document Type: Conference Paper

References (5)

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