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Volumn 28, Issue 23, 2016, Pages 4713-4719

Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors

(6) Hu, Yuanyuan a Pecunia, Vincenzo a Jiang, Lang a Di, Chong An b Gao, Xike c Sirringhaus, Henning a

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

b INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

c SHANGHAI INSTITUTE OF ORGANIC CHEMISTRY (China)

Author keywords

minority carriers; organic transistors; scanning Kelvin probe microscopy

Indexed keywords

CHARGE CARRIERS; CHLORINE COMPOUNDS; ORGANIC FIELD EFFECT TRANSISTORS; SCANNING; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SILICON; THRESHOLD VOLTAGE;

KELVIN PROBE MEASUREMENTS; MINORITY CARRIER; NITROGEN ATMOSPHERES; OCTADECYLTRICHLOROSILANE; ORGANIC TRANSISTOR; SCANNING KELVIN PROBE MICROSCOPY; SWITCHING CHARACTERISTICS; THRESHOLD VOLTAGE SHIFTS;

TRANSISTORS;

EID: 84973642013 PISSN: 09359648 EISSN: 15214095 Source Type: Journal
DOI: 10.1002/adma.201503812 Document Type: Article

Times cited : (36)

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