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Volumn , Issue , 2001, Pages 56-60

High K gate dielectrics for the silicon industry

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; AMORPHOUS SILICON; CHEMICAL INDUSTRY; DIELECTRIC MATERIALS; RECONFIGURABLE HARDWARE; SILICATES; SILICON OXIDES;

EID: 84954155485     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWGI.2001.967545     Document Type: Conference Paper
Times cited : (18)

References (12)
  • 1
    • 0033600230 scopus 로고    scopus 로고
    • The electronic structure of the atomic scale of ultra-thin gate oxides
    • D. Muller et al., "The electronic structure of the atomic scale of ultra-thin gate oxides" Nature, p 758, 1999.
    • (1999) Nature , pp. 758
    • Muller, D.1
  • 3
    • 0032256250 scopus 로고    scopus 로고
    • 3 with Low leakage and Low Interface States
    • 3 with Low leakage and Low Interface States", the IEDM Digest, p 605, 1998.
    • (1998) The IEDM Digest , pp. 605
    • Manchanda, L.1
  • 4
    • 0033712917 scopus 로고    scopus 로고
    • 3 Gate Dielectrics with Equivalent Oxide Thickness 0.5-1nm
    • 3 Gate Dielectrics with Equivalent Oxide Thickness 0.5-1nm", VLSI Technology Symposium Digest, p16, 2000.
    • (2000) VLSI Technology Symposium Digest , pp. 16
    • Chin, A.1
  • 7
    • 0346534582 scopus 로고    scopus 로고
    • Hafnium and Zirconium Silicates for Advanced Gate Dielectrics
    • G. Wilk, R. M. Wallace and J. M. Anthony, "Hafnium and Zirconium Silicates for Advanced Gate Dielectrics" J. Applied Physics' V87, p484, 2000.
    • (2000) J. Applied Physics' , vol.87 , pp. 484
    • Wilk, G.1    Wallace, R.M.2    Anthony, J.M.3
  • 8
    • 0033315071 scopus 로고    scopus 로고
    • Zirconium based gate dielectrics with equivalent oxide thickness less than 1.0nm, performance of submicron-MOSFET using a Nitride Gate Replacement Process
    • Y. Ma et al, Zirconium based gate dielectrics with equivalent oxide thickness less than 1.0nm, performance of submicron-MOSFET using a Nitride Gate Replacement Process, The IEDM Technical Digest, p 149, 2000.
    • (2000) The IEDM Technical Digest , pp. 149
    • Ma, Y.1
  • 9
    • 0034454053 scopus 로고    scopus 로고
    • Si-doped aluminates for high temperature Metal Gate CMOS: Zr-Al-Si-O, A Novel Gate Dielectric for Low Power Applications
    • L. Manchanda et al, Si-doped aluminates for high temperature Metal Gate CMOS: Zr-Al-Si-O, A Novel Gate Dielectric for Low Power Applications, The IEDM Technical Digest, p 23, 2000.
    • (2000) The IEDM Technical Digest , pp. 23
    • Manchanda, L.1
  • 10
    • 0016495043 scopus 로고
    • Aluminum oxide/silicon dioxide, double insulator, MOS structure
    • and references in this paper
    • J. T. Clemens et al, Aluminum oxide/silicon dioxide, double insulator, MOS structure, Bell System Technical Journal, p 687, 1975 and references in this paper..
    • (1975) Bell System Technical Journal , pp. 687
    • Clemens, J.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.