-
1
-
-
0032294432
-
Viscoelastic Study of a Conductive Adhesive for Electronic Packages, Part 2: Thermal Stress Analysis Using Finite Element Method
-
Akay, H.U., Paydar, N.H., Zhang, H. & Glogas, G. 1998. Viscoelastic Study of a Conductive Adhesive for Electronic Packages, Part 2: Thermal Stress Analysis Using Finite Element Method. International Journal of Microelectronic Packaging, Materials and Technologies, Vol. 1, No. 3, pp. 225-233.
-
(1998)
International Journal of Microelectronic Packaging, Materials and Technologies
, vol.1
, Issue.3
, pp. 225-233
-
-
Akay, H.U.1
Paydar, N.H.2
Zhang, H.3
Glogas, G.4
-
3
-
-
0026378024
-
Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation
-
Atlanta, May 11-16
-
Darveaux, R. & Banerji, K. 1991. Fatigue Analysis of Flip Chip Assemblies Using Thermal Stress Simulations and a Coffin-Manson Relation. Proceedings of the 41st Electronic Component and Technology Conference, Atlanta, May 11-16. Pp. 797-805.
-
(1991)
Proceedings of the 41st Electronic Component and Technology Conference
, pp. 797-805
-
-
Darveaux, R.1
Banerji, K.2
-
4
-
-
0027814190
-
Failure Mechanism Models for Cyclic Fatigue
-
Dasgupta, A. 1993. Failure Mechanism Models for Cyclic Fatigue. IEEE Transactions on Reliability, Vol. 42, No. 4, pp. 548-555.
-
(1993)
IEEE Transactions on Reliability
, vol.42
, Issue.4
, pp. 548-555
-
-
Dasgupta, A.1
-
5
-
-
0030245439
-
Prediction of Thermal Fatigue Life for Encapsulated Flip Chip Interconnection
-
Doi, K., Hirano, N., Okada, T., Hiruta, Y. & Sudo, T. 1996. Prediction of Thermal Fatigue Life for Encapsulated Flip Chip Interconnection. International Journal of Microcircuits and Electronic Packaging, Vol. 19, No. 3, pp. 231-237.
-
(1996)
International Journal of Microcircuits and Electronic Packaging
, vol.19
, Issue.3
, pp. 231-237
-
-
Doi, K.1
Hirano, N.2
Okada, T.3
Hiruta, Y.4
Sudo, T.5
-
6
-
-
0030257901
-
Mechanical Failure in COB-Technology Using Glob-Top Encapsulation
-
October 1996
-
Dudek, R., Vogel, D. & Michel, B. 1996. Mechanical Failure in COB-Technology Using Glob-Top Encapsulation. IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part C, Vol. 19, No. 4, October 1996, pp. 232-240.
-
(1996)
IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part C
, vol.19
, Issue.4
, pp. 232-240
-
-
Dudek, R.1
Vogel, D.2
Michel, B.3
-
7
-
-
0032093433
-
FE-Simulation for Polymeric Packaging Materials
-
Dudek, R., Scherzer, M. & Schubert, A. 1998. FE-Simulation for Polymeric Packaging Materials. IEEE Transactions on Components, Hybrids, and Manufacturing Technology - Part A, Vol. 21, No. 2, pp. 301-309.
-
(1998)
IEEE Transactions on Components, Hybrids, and Manufacturing Technology - Part A
, vol.21
, Issue.2
, pp. 301-309
-
-
Dudek, R.1
Scherzer, M.2
Schubert, A.3
-
8
-
-
0029718117
-
Thermo-Structural Behaviour of Underfilled Flip Chips
-
Orlando, May 28-31
-
Gektin, V., Bar-Cohen, A. & Witzman, S. 1996. Thermo-Structural Behaviour of Underfilled Flip Chips. Proceedings of the IEEE 46th Electronic Components and Technology Conference, Orlando, May 28-31. Pp. 440-447.
-
(1996)
Proceedings of the IEEE 46th Electronic Components and Technology Conference
, pp. 440-447
-
-
Gektin, V.1
Bar-Cohen, A.2
Witzman, S.3
-
9
-
-
0031234011
-
Coffin-Manson Fatigue Model of Underfilled Flip-Chips
-
Gektin, V., Bar-Cohen, A. & Ames, J. 1997. Coffin-Manson Fatigue Model of Underfilled Flip-Chips. IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part A, Vol. 20, No. 3, pp. 317-326.
-
(1997)
IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part A
, vol.20
, Issue.3
, pp. 317-326
-
-
Gektin, V.1
Bar-Cohen, A.2
Ames, J.3
-
10
-
-
0001661250
-
Dynamic-Mechanical Properties
-
Allen, G. & Bevington, J.C. (ed.). Polymer Properties. Pergamon Press
-
Gradin, P., Howgate, P.G., Seldénn, R. & Brown, R.A. 1989. Dynamic-Mechanical Properties. In: Allen, G. & Bevington, J.C. (ed.). Comprehensive Polymer Science, Volume 2, Polymer Properties. Pergamon Press. 798 p.
-
(1989)
Comprehensive Polymer Science
, vol.2
-
-
Gradin, P.1
Howgate, P.G.2
Seldénn, R.3
Brown, R.A.4
-
12
-
-
0004093302
-
-
McGraw-Hill
-
Lau, J.H. & Pao, Y.H. 1997. Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies. McGraw-Hill. 408 p. ISBN 0-07-036648-9.
-
(1997)
Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies
-
-
Lau, J.H.1
Pao, Y.H.2
-
13
-
-
0032315652
-
Flip Chip Interconnection of DNA Chip Devices
-
San Diego, November 1-4
-
LeClair, T., Harper, A., Graham, S. & Ackley, D. 1998. Flip Chip Interconnection of DNA Chip Devices. Proceedings of the International Symposium on Microelectronics, San Diego, November 1-4. Pp. 732-736.
-
(1998)
Proceedings of the International Symposium on Microelectronics
, pp. 732-736
-
-
LeClair, T.1
Harper, A.2
Graham, S.3
Ackley, D.4
-
14
-
-
84952316564
-
Failure Analysis of Solder Joints in a Ceramic Filter
-
Oslo, September 21-24
-
th ISHM-Nordic Annual Conference, Oslo, September 21-24. Pp. 161-169.
-
(1997)
th ISHM-Nordic Annual Conference
, pp. 161-169
-
-
Lenkkeri, J.1
-
18
-
-
0030407701
-
A Mechanical Reliability Evaluation of Several Electrically Conductive Epoxies Part II: Thermal Stability and Thermo-Mechanical Creep
-
Atlanta, November 17-22
-
Rafanelli, A.J. 1996b. A Mechanical Reliability Evaluation of Several Electrically Conductive Epoxies Part II: Thermal Stability and Thermo-Mechanical Creep. Proceedings of the ASME International Mechanical Engineering Congress and Exposition, Atlanta, November 17-22. Pp. 45-58.
-
(1996)
Proceedings of the ASME International Mechanical Engineering Congress and Exposition
, pp. 45-58
-
-
Rafanelli, A.J.1
-
19
-
-
0032714768
-
Deformation Behaviour of Dilute SnBi (0.5 to 6 At. Pet) Solid Solutions
-
January 1999
-
Reinikainen, T. & Kivilahti J. 1999. Deformation Behaviour of Dilute SnBi (0.5 to 6 At. Pet) Solid Solutions. Metallurgical and Materials Transactions, Vol. 30A, January 1999, pp. 123-132.
-
(1999)
Metallurgical and Materials Transactions
, vol.30 A
, pp. 123-132
-
-
Reinikainen, T.1
Kivilahti, J.2
-
20
-
-
0142234563
-
Thermal Stress Induced Failures in Adhesive Flip Chip Joints
-
Rusanen, O. & Lenkkeri, J. 1999. Thermal Stress Induced Failures in Adhesive Flip Chip Joints. International Journal of Microcircuits & Electronic Packaging, Vol. 22, No. 4, pp. 363-369.
-
(1999)
International Journal of Microcircuits & Electronic Packaging
, vol.22
, Issue.4
, pp. 363-369
-
-
Rusanen, O.1
Lenkkeri, J.2
-
22
-
-
27144491858
-
Process Induced Residual Stresses in Isotropically Conductive Adhesive Joints
-
Stockholm, June 3-5
-
Wu, S.W., Mei, Y., Yeh, C. & Wyatt, K. 1996. Process Induced Residual Stresses in Isotropically Conductive Adhesive Joints. Proceedings of Adhesives in Electronics '96, Stockholm, June 3-5. Pp. 133-140.
-
(1996)
Proceedings of Adhesives in Electronics '96
, pp. 133-140
-
-
Wu, S.W.1
Mei, Y.2
Yeh, C.3
Wyatt, K.4
-
23
-
-
0030172955
-
Parametric Finite Element Analysis of Flip Chip Reliability
-
Yeh, C., Zhou, W.X. & Wyatt, K. 1996. Parametric Finite Element Analysis of Flip Chip Reliability. International Journal of Microcircuits and Electronic Packaging, Vol. 19, No. 2, pp. 120-127.
-
(1996)
International Journal of Microcircuits and Electronic Packaging
, vol.19
, Issue.2
, pp. 120-127
-
-
Yeh, C.1
Zhou, W.X.2
Wyatt, K.3
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