Optical constants and band gap determination of Pb0.95La0.05Zr0.54Ti0.46O3 thin films using spectroscopic ellipsometry and UV-visible spectroscopy

Optical Materials

Volumn 49, Issue , 2015, Pages 123-128

  Batra, Vaishali ^a   Kotru, Sushma ^a   Varagas, M ^b   Ramana, C V ^b  

^a University of Alabama   (United States)

^b 500 W University Avenue   (United States)

Author keywords

Annealing; Band gap; Chemical solution deposition; Optical constants; PLZT

Indexed keywords

ANNEALING; CHEMICALS; DEPOSITION; ENERGY GAP; FERROELECTRIC CERAMICS; INFRARED SPECTROPHOTOMETERS; LANTHANUM COMPOUNDS; LEAD ZIRCONATE TITANATE; OPTICAL CONSTANTS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; TITANIUM COMPOUNDS; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; ZIRCONIUM COMPOUNDS;

CHEMICAL SOLUTION DEPOSITION; INDUCED CRYSTALLIZATION; LANTHANUM DOPED LEAD ZIRCONATE TITANATE; PLZT; POLYCRYSTALLINE STRUCTURE; POST DEPOSITION ANNEALING; STRUCTURAL EVOLUTION; UV VISIBLE SPECTROSCOPY;

THIN FILMS;

EID: 84944742168     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2015.08.019     Document Type: Article

References (47)

1. M. Ichiki, Y. Morikawa, and T. Nakada Electrical properties of ferroelectric lead lanthanum zirconate titanate as an energy transducer for application to electrostatic-optical motor Jpn. J. Appl. Phys. 41 2002 6993 6996
2. K. Uchino, and M. Aizawa Photostrictive actuator using PLZT ceramics Jpn. J. Appl. Phys. 24 1985 139 141
3. A. Zomorrodian, N.J. Wu, Y. Song, S. Stahl, A. Ignatiev, E.B. Trexler, and C.A. Garcia Micro photo detector fabricated of ferroelectric metal heterostructures Jpn. J. Appl. Phys. 44 2005 6105 6108
4. K. Uchiyama, A. Kasamatsu, Y. Otani, and T. Shiosaki Electro-optic properties of lanthanum-modified lead zirconate titanate thin films epitaxially grown by the advanced sol-gel method Jpn. J. Appl. Phys. 46 2007 L244 L246
5. 3 films with various Zr/Ti ratios Jpn. J. Appl. Phys. 47 2008 7541 7544
6. 3 thin films and ceramics J. Appl. Phys. 76 1994 4305 4315
7. H.T. Huang Solar energy: ferroelectric photovoltaics Nat. Photonics 4 2010 134 135
8. M. Qin, K. Yao, and Y.C. Liang High efficient photovoltaics in nanoscaled ferroelectric thin films Appl. Phys. Lett. 93 2008 122904 (1-3)
9. S.Y. Yang, J. Seidel, S.J. Byrnes, P. Shafer, C.H. Yang, M.D. Rossell, P. Yu, Y.H. Chu, J.F. Scott, J.W. Ager, L.W. Martin, and R. Ramesh Above bandgap voltages from ferroelectric photovoltaic devices Nat. Nanotechnol. 5 2010 143 147
10. 3 polycrystalline film fabricated by metalorganic chemical-liquid deposition Appl. Phys. Lett. 74 1999 3116 3118
11. S.B. Xiong, Z.G. Liu, X.Y. Chen, X.L. Guo, X. Liu, and S.N. Zhu Pulsed-laser deposition and characterization of optical wave-guiding (Pb, La)(Zr, Ti)O3 thin films Appl. Phys. Lett. 67 1995 2729 2731
12. M. Gaidi, A. Amassian, M. Cahker, M. Kulishov, and L. Martinu Pulsed laser deposition of PLZT films: structural and optical characterization Appl. Surf. Sci. 226 2004 347 354
13. 3 films for optical memories Integr. Ferroelectr. 5 1994 47 58
14. M. Ichiki, T. Shimasaki, H. Yoshii, T. Asahi, J. Kobayashi, and H. Ikawa Opical properties of PLZT Ferroelectrics 152 1994 289 293
15. H.W. Choi, Y.S. Park, J. Dougherty, N.W. Jang, and C.Y. Park Electrical and optical properties of PLZT thin films on ITO coated glass by sol-gel processing J. Mater. Sci. 35 2000 1475 1479
16. M. Okuyama, T. Usuki, Y. Hamakawa, and T. Nakagawa Epitaxial growth of ferroelectric PLZT thin film and their optical properties Appl. Phys. 21 1980 339 343
17. 3 thin films: effect of substrate and optical properties J. Vac. Sci. Technol., A 27 2009 548 553
18. W.J. Leng, C.R. Yang, H. Ji, J.H. Zhang, H.W. Chen, and J.L. Tang Structure-related optical properties of (Pb,La)(Zr,Ti)O3 thin films on indium tin oxide/quartz substrates J. Appl. Phys. 100 2006 083505 (1-6)
19. 3 thin films grown by pulsed laser deposition Appl. Surf. Sci. 158 2000 185 189
20. Q. Sun, H. Deng, X. Li, P. Yang, and J. Chu The influence of La content on properties of PLZT thin films J. Phys: Conf. Ser. 276 2011 012186 (1-5)
21. K. Sato, M. Ishii, K. Kurihara, and M. Kondo Crystal orientation dependence of the electro-optic effect in epitaxial lanthanum-modified lead zirconate titanate films Appl. Phys. Lett. 87 2005 251927 (1-3)
22. V.N. Harshan, and S. Kotru Effect of annealing on ferroelectric properties of lanthanum modified lead zirconate titanate thin films Integr. Ferroelectr. 130 2011 73 83
23. 3 thin films under dark and illuminated conditions Ferroelectrics 470 2014 99 106
24. V. Batra, V.N. Harshan, S. Kotru, Submitted for publication.
25. 3 thin films J. Phys. D Appl. Phys. 36 2003 2141 2145
26. B.D. Cullity, and R. Stock S.R. Elements of X-ray Diffraction 2001 Prentice Hall
27. C.V. Ramana, E.J. Rubio, C.D. Barraza, A.M. Gallardo, S. McPeak, S. Kotru, and J.T. Grant Chemical bonding, optical constants, and electrical resistivity of sputter-deposited gallium oxide thin films J. Appl. Phys. 115 2014 043508 (1-9)
28. R. Singh, T.C. Goel, and S. Chandra Effect of post-deposition annealing on phase formation and properties of RF magnetron sputtered PLZT thin films Mater. Res. Bull. 43 2008 384 393
29. S.K. Gullapalli, R.S. Vemuri, and C.V. Ramana Structural transformation induced changes in the optical properties of nanocrystalline tungsten oxide thin films Appl. Phys. Lett. 96 2010 171903 (1-3)
30. S.S. Kumar, E.J. Rubio, M. Noor-A-Alam, G. Martinez, S. Manandhar, V. Shutthanandan, S. Thevuthasan, and C.V. Ramana Structure, morphology, and optical properties of amorphous and nanocrystalline gallium oxide thin films J. Phys. Chem. C 117 2013 4194 4200
31. G.F.A. Kortum, Reflectance Spectroscopy: Principles, Methods, Applications, New York, 1969.
32. G. Burgeth, and H. Kisch Photocatalytic and photoelectrochemical properties of titania chloroplatinate (IV) Coord. Chem. Rev. 230 2002 41 47
33. E.L. Simmons Diffuse reflectance spectroscopy: a comparison of the theories Appl. Opt. 14 1975 1380 1386
34. 2 on its optical property and photocatalytic reactivity exemplified by 2-chlorophenol Appl. Catal. B: Environ. 68 2006 1 11
35. C.G. Granqvist Handbook of Inorganic Electrochromic Materials 1995 Elsevier New York
36. 3 thin film by spectroscopic ellipsometry J. Nanosci. Nanotechnol. 13 2013 1 7
37. 3 thin films ACS Appl. Mater. Interfaces 4 2012 1371 1377
38. 3 thin films deposited by radio-frequency magnetron sputtering J. Mater. Sci.: Mater. Electron. 17 2006 1041 1045
39. 3 thin films Appl. Phys. Lett. 79 2001 3767 3769
40. G.E. Jellison Spectroscopic ellipsometry data analysis: measured versus calculated quantities Thin Solid Films 313-314 1998 33 39 < http://www.sciencedirect.com/science/journal/00406090/313/supp/C >
41. H. Fujiwara Spectroscopic Ellipsometry: Principles and Applications 2007 John Wiley & Sons Inc. Chichester, U.K.
42. 3) thin films Opt. Mater. 34 2012 893 900
43. F.A. Jenkins, and H.E. White Fundamentals of Optics 4th ed. 1981 McGrawHill, Inc.
44. S.T. McKinstry, H. Hu, S.B. Krupanidhi, P. Chindaudom, K. Vedam, and R.E. Newnham Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O3 films on sapphire and Pt-coated silicon substrates Thin Solid Films 230 1993 15 27
45. 3 (x = 0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry Mater. Chem. Phys. 103 2007 329 333
46. 3 J. Lumin. 157 2015 303 309
47. 3 single crystals Mater. Lett. 84 2012 114 115