Structure-related optical properties of (Pb,La) (Zr,Ti) O3 thin films on indium tin oxidequartz substrates

Journal of Applied Physics

Volumn 100, Issue 8, 2006, Pages

  Leng, W J ^a   Yang, C R ^a   Ji, H ^a   Zhang, J H ^a   Chen, H W ^a   Tang, J L ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INDIUM COMPOUNDS; LEAD COMPOUNDS; MAGNETRON SPUTTERING; OPTICAL PROPERTIES; SURFACE ROUGHNESS; X RAY DIFFRACTION;

INDIUM TIN OXIDE; NEAR INFRARED WAVELENGTH; OPTICAL INDEX; PLZT FILMS;

FERROELECTRIC THIN FILMS;

EID: 33750512773     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2357988     Document Type: Article

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