Electrooptic and piezoelectric properties of (Pb,La)(Zr,Ti)O3 films with various Zr/Ti ratios

Japanese Journal of Applied Physics

Volumn 47, Issue 9 PART 2, 2008, Pages 7541-7544

  Shima, Hiromi ^a   Iijima, Takashi ^b   Funakubo, Hiroshi ^c   Nakajima, Takashi ^a   Naganuma, Hiroshi ^a   Okamura, Soichiro ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electrooptic; Piezoelectric; PLZT film; Pockels coefficient; Refractive index; Zr Ti ratio

Indexed keywords

LANTHANUM; LEAD; LEAD ALLOYS; LIGHT MODULATION; LIGHT MODULATORS; LIGHT REFRACTION; LIQUID MEMBRANES; MAGNETIC FILMS; MOLECULAR BEAM EPITAXY; OPTICAL INSTRUMENTS; OPTICAL PROPERTIES; PIEZOELECTRICITY; REFLECTION; REFRACTIVE INDEX; REFRACTOMETERS; SILICON; PIEZOELECTRIC TRANSDUCERS;

ELECTROOPTIC; PIEZOELECTRIC; PLZT FILM; POCKELS COEFFICIENT; ZR/TI RATIO;

ZIRCONIUM;

EID: 55149089284     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.7541     Document Type: Article

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