Identifying facile and accurate methods to measure the thickness of the active layers of thin-film composite membranes - A comparison of seven characterization techniques

Journal of Membrane Science

Volumn 498, Issue , 2016, Pages 167-179

  Lin, Lin ^a   Feng, Chengcheng ^a,b   Lopez, Rene ^c   Coronell, Orlando ^a  

^a University of North Carolina at Chapel Hill   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c The University of North Carolina at Chapel Hill   (United States)

Author keywords

Active layer thickness; Density; Ellipsometry; Nanofiltration; Reverse osmosis

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (SPECIFIC GRAVITY); ELECTRON MICROSCOPY; ELLIPSOMETRY; FILM THICKNESS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOFILTRATION; OSMOSIS MEMBRANES; PROFILOMETRY; QUARTZ CRYSTAL MICROBALANCES; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ACTIVE LAYER; CHARACTERIZATION TECHNIQUES; POLYAMIDE ACTIVE LAYERS; RUTHERFORD BACK-SCATTERING SPECTROMETRY; SEAWATER REVERSE OSMOSIS; THIN FILM COMPOSITE MEMBRANES; THIN-FILM COMPOSITE MEMBRANE; TRANSMISSION ELECTRON MICROSCOPY TEM;

COMPOSITE MEMBRANES;

POLYAMIDE; SEA WATER;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; DENSITY; DIFFUSION COEFFICIENT; ELLIPSOMETRY; INTERMETHOD COMPARISON; MEASUREMENT ACCURACY; MEMBRANE; MEMBRANE PERMEABILITY; NANOFILTRATION; PARTITION COEFFICIENT; PRIORITY JOURNAL; PROFILOMETRY; QUARTZ CRYSTAL MICROBALANCE; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SOLUTE; SPECTROMETRY; THICKNESS; THIN FILM COMPOSITE MEMBRANE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84944193845     PISSN: 03767388     EISSN: 18733123     Source Type: Journal    
DOI: 10.1016/j.memsci.2015.09.059     Document Type: Article

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