N-Hexane induced swelling of thin PDMS films under non-equilibrium nanofiltration permeation conditions, resolved by spectroscopic ellipsometry

Journal of Membrane Science

Volumn 431, Issue , 2013, Pages 233-243

  Ogieglo, Wojciech ^a   van der Werf, Hans ^a   Tempelman, Kristianne ^a   Wormeester, Herbert ^a   Wessling, Matthias ^b   Nijmeijer, Arian ^a   Benes, Nieck E ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

In situ characterization; Polydimethylsiloxane (PDMS); Solution diffusion; Solvent resistant nanofiltration; Spectroscopic ellipsometry

Indexed keywords

BULK SAMPLES; CROSSLINKER; EXPERIMENTAL CONDITIONS; FLORY-HUGGINS; FLORY-REHNER THEORY; IN-SITU ANALYSIS; IN-SITU CHARACTERIZATION; INTERACTION PARAMETERS; MEMBRANE SWELLING; MIXED MODE; N-HEXANE; NON EQUILIBRIUM; NON-DESTRUCTIVE TECHNIQUE; PDMS FILMS; POLYDIMETHYLSILOXANE PDMS; PRESSURE DIFFERENCES; SIMULTANEOUS MEASUREMENT; SOLUTION-DIFFUSION; SOLUTION-DIFFUSION MODEL; SOLVENT INDUCED; SOLVENT RESISTANT NANOFILTRATION; SOLVENT SORPTION; SWOLLEN FILMS; TEST CELL; UPSTREAM PRESSURE;

HEXANE; MICROCHANNELS; NANOFILTRATION; REFRACTIVE INDEX; SOLVENTS; SORPTION; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

SILICONES;

DIMETICONE; HEXANE; NANOFILM; SOLVENT;

ARTICLE; DIFFUSION; ELASTICITY; ELLIPSOMETRY; FLOW KINETICS; MEMBRANE PERMEABILITY; NANOFILTRATION; POROSITY; PRESSURE; PRIORITY JOURNAL; REFRACTION INDEX; SOLUTION AND SOLUBILITY;

EID: 84873262978     PISSN: 03767388     EISSN: 18733123     Source Type: Journal    
DOI: 10.1016/j.memsci.2012.12.045     Document Type: Article

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