Physico-chemical characterization of NF/RO membrane active layers by Rutherford backscattering spectrometry

Journal of Membrane Science

Volumn 282, Issue 1-2, 2006, Pages 71-81

  Mi, Baoxia ^a   Coronell, Orlando ^a   Mariñas, Benito J ^a   Watanabe, Fumiya ^a   Cahill, David G ^a   Petrov, Ivan ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Membrane active layer thickness; Membrane elemental composition; Nanofiltration; RBS; Reverse osmosis; Roughness; Rutherford backscattering spectrometry

Indexed keywords

NANOFILTRATION; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

MEMBRANE ACTIVE LAYER THICKNESS; MEMBRANE ACTIVE LAYERS; MEMBRANE ELEMENTAL COMPOSITION; SULFONATED-POLYETHERSULFONE (SPES);

POLYMERIC MEMBRANES;

POLYAMIDE; POLYSTYRENESULFONIC ACID; POLYVINYL ALCOHOL; SULFONE DERIVATIVE;

NANOFILTRATION; POLYMERIC MEMBRANES; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

ACCURACY; ANALYTIC METHOD; ARTICLE; LIGHT SCATTERING; MEMBRANE BINDING; MEMBRANE STRUCTURE; PHYSICAL CHEMISTRY; POROSITY; PRIORITY JOURNAL; RUTHERFORD BACKSCATTERING SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 33747761298     PISSN: 03767388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.memsci.2006.05.015     Document Type: Article

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