Glass transition temperature and thermal expansion behaviour of polymer films investigated by variable temperature spectroscopic ellipsometry

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 803-807

  Kahle, O ^a   Wielsch, U ^b   Metzner, H ^c   Bauer, J ^a   Uhlig, C ^a   Zawatzki, C ^d  

^a FRAUNHOFER IZM   (Germany)

^b SENTECH INSTRUMENTS GMBH   (Germany)

^c Steremat Elektrowärme GmbH   (Germany)

^d FRAUNHOFER HEINRICH HERTZ INSTITUTE   (Germany)

Author keywords

Glass transition; PMMA; Spectroscopic ellipsometry; Thermal expansion; Thin polymer films

Indexed keywords

ELLIPSOMETRY; GLASS TRANSITION; OPTICAL PROPERTIES; POLYMETHYL METHACRYLATES; SILICON WAFERS; SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS; THERMAL EXPANSION; THIN FILMS;

SPECTROSCOPIC ELLIPSOMETRY;

PLASTIC FILMS;

EID: 0031998532     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00999-1     Document Type: Article

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