Spectroscopic ellipsometry analysis of a thin film composite membrane consisting of polysulfone on a porous α-alumina support

ACS Applied Materials and Interfaces

Volumn 4, Issue 2, 2012, Pages 935-943

  Ogieglo, Wojciech ^a   Wormeester, Herbert ^a   Wessling, Matthias ^a,c   Benes, Nieck E ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

alumina; polysulfone; porous support; spectroscopic ellipsometry; surface roughness; thin film composite membranes

Indexed keywords

ALUMINA SUPPORT; AMBIENT INTERFACES; HIGH PRECISION; IN-SITU; IN-SITU STUDY; INTERFACIAL REGION; MEMBRANE PERFORMANCE; MERCURY POROSIMETRY; NONEQUILIBRIUM SYSTEM; OPTICAL MODELS; POLYSULFONE FILM; POROSITY PROFILES; POROUS ALUMINA MEMBRANES; POROUS SUPPORT; THIN FILM COMPOSITE MEMBRANES; THIN POLYMER FILMS;

ALUMINA; ATOMIC FORCE MICROSCOPY; COMPOSITE MEMBRANES; MEMBRANE TECHNOLOGY; MERCURY (METAL); POLYMER FILMS; POLYSULFONES; SURFACE ROUGHNESS; THIN FILMS; VAPOR DEPOSITION;

SPECTROSCOPIC ELLIPSOMETRY;

EID: 84857376682     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am2015958     Document Type: Article

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