Growth dynamics of interfacially polymerized polyamide layers by diffuse reflectance spectroscopy and Rutherford backscattering spectrometry

Journal of Membrane Science

Volumn 429, Issue , 2013, Pages 71-80

  Matthews, Tamlin D ^a,b   Yan, Huan ^a,b   Cahill, David G ^a,b   Coronell, Orlando ^b,c   Mariñas, Benito J ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^c University of North Carolina at Chapel Hill   (United States)

Author keywords

Atomic force microscopy (AFM); Diffuse reflectance spectroscopy; Interfacial polymerization; Polyamide; Reverse osmosis; Rutherford backscattering spectrometry (RBS)

Indexed keywords

ACTIVE LAYER; AFM; AROMATIC POLYAMIDES; DIFFUSE OPTICAL REFLECTANCE; DIFFUSE REFLECTANCE; DIFFUSE REFLECTANCE SPECTROSCOPY; GROWTH DYNAMICS; INTERFACIAL POLYMERIZATION; M PHENYLENEDIAMINE; POLYAMIDE FILMS; POROUS POLYSULFONES; RUTHERFORD BACKSCATTERING SPECTROMETRY; TRIMESOYL CHLORIDE;

ATOMIC FORCE MICROSCOPY; CHLORINE COMPOUNDS; DYNAMICS; HEXANE; POLYAMIDES; POLYMERIZATION; REFLECTION; REVERSE OSMOSIS;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

1,3 PHENYLENEDIAMINE; POLYAMIDE; POLYSULFONE; WATER;

ARTICLE; ARTIFICIAL MEMBRANE; ATOMIC FORCE MICROSCOPY; DIFFUSE REFLECTANCE SPECTROSCOPY; MOLECULAR DYNAMICS; POLYMERIZATION; POROSITY; PRIORITY JOURNAL; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROMETRY; SPECTROMETRY; SYNTHESIS;

EID: 84871432875     PISSN: 03767388     EISSN: 18733123     Source Type: Journal    
DOI: 10.1016/j.memsci.2012.11.040     Document Type: Article

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