Physico-chemical integrity of nanofiltration/reverse osmosis membranes during characterization by Rutherford backscattering spectrometry

Journal of Membrane Science

Volumn 291, Issue 1-2, 2007, Pages 77-85

  Mi, Baoxia ^a   Cahill, David G ^b   Mariñas, Benito J ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Membrane active layer thickness; Membrane elemental composition; Membrane roughness; Nanofiltration; Reverse osmosis; Rutherford backscattering spectrometry (RBS)

Indexed keywords

CHEMICAL ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MEMBRANES; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

MEMBRANE ACTIVE LAYER THICKNESS; MEMBRANE ELEMENTAL COMPOSITION; MEMBRANE ROUGHNESS;

NANOFILTRATION;

CHEMICAL ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MEMBRANES; NANOFILTRATION; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY;

ARTICLE; CHEMICAL COMPOSITION; CONTROLLED STUDY; INFRARED SPECTROSCOPY; MEMBRANE COMPONENT; MEMBRANE FILTER; MEMBRANE MODEL; MEMBRANE STRUCTURE; NANOFILTRATION; PHYSICAL CHEMISTRY; PRIORITY JOURNAL; REVERSE OSMOSIS; RUTHERFORD BACKSCATTERING SPECTROMETRY; SCANNING ELECTRON MICROSCOPE; SPECTROMETRY;

EID: 33847319218     PISSN: 03767388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.memsci.2006.12.052     Document Type: Article

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