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Volumn 2003-January, Issue , 2003, Pages 91-96

Modeling feedback bridging faults with non-zero resistance

Author keywords

Automatic test pattern generation; Benchmark testing; Bridge circuits; Bridges; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Feedback loop; Signal resolution

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; BRIDGE CIRCUITS; BRIDGES; CIRCUIT SIMULATION; SIGNAL DETECTION;

EID: 84942843933     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2003.1231674     Document Type: Conference Paper
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.