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Volumn 15, Issue 9, 2015, Pages 5944-5949

Toward Two-Dimensional All-Carbon Heterostructures via Ion Beam Patterning of Single-Layer Graphene

Author keywords

amorphization; focused ion beam; Graphene; scanning transmission electron microscopy

Indexed keywords

AMORPHIZATION; AMORPHOUS CARBON; ATOMS; CHEMICAL SENSORS; ELECTRON MICROSCOPY; FOCUSED ION BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BEAMS; IONS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84941118788     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.5b02063     Document Type: Article
Times cited : (100)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.