Detecting swift heavy ion irradiation effects with graphene

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 314, Issue , 2013, Pages 18-20

  Ochedowski, O ^a   Akcoltekin S ^a   Ban D'Etat, B ^b   Lebius, H ^b   Schleberger, M ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b Direction de la Recherche Fondamentale   (France)

Author keywords

Graphene; Swift heavy ion

Indexed keywords

AMBIENT CONDITIONS; GLANCING ANGLE; MECHANICAL EXFOLIATION; SHI IRRADIATION; SINGLE LAYER; SWIFT HEAVY ION IRRADIATION; SWIFT HEAVY IONS; VARIOUS SUBSTRATES;

ATOMIC FORCE MICROSCOPY; HEAVY IONS; IRRADIATION;

GRAPHENE;

EID: 84886587797     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2013.03.063     Document Type: Article

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