Nanomechanical investigation of thin-film electroceramic/metal-organic framework multilayers

Applied Physics Letters

Volumn 107, Issue 10, 2015, Pages

  Best, James P ^a   Michler, Johann ^a   Liu, Jianxi ^b   Wang, Zhengbang ^b   Tsotsalas, Manuel ^b   Maeder, Xavier ^a   Röse, Silvana ^b,c   Oberst, Vanessa ^b   Liu, Jinxuan ^b   Walheim, Stefan ^b   Gliemann, Hartmut ^b   Weidler, Peter G ^b   Redel, Engelbert ^b   Wöll, Christof ^b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEFORMATION; EPITAXIAL GROWTH; FILM PREPARATION; FILM THICKNESS; FILMS; INDIUM; JAVA PROGRAMMING LANGUAGE; MULTILAYERS; ORGANOMETALLICS; THIN FILM DEVICES; TIN OXIDES;

DEFORMATION MECHANISM; DEGREE OF PRECISION; INTERFACIAL ROUGHNESS; METAL ORGANIC FRAMEWORK; NANO-MECHANICAL INVESTIGATIONS; RESISTANCE TO DEFORMATION; SUBSTRATE PROPERTIES; THIN FILM MULTILAYERS;

THIN FILMS;

EID: 84941090937     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4930141     Document Type: Article

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