On the dielectric and optical properties of surface-anchored metal-organic frameworks: A study on epitaxially grown thin films

Applied Physics Letters

Volumn 103, Issue 9, 2013, Pages

  Redel, Engelbert ^a   Wang, Zhengbang ^a   Walheim, Stefan ^a   Liu, Jinxuan ^a   Gliemann, Hartmut ^a   Wöll, Christof ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC AND OPTICAL PROPERTIES; EPITAXIALLY GROWN; FABRICATION PROCESS; INTERFERENCE COLOR; METAL ORGANIC FRAMEWORK; METALORGANIC FRAMEWORKS (MOFS); SILICON SUBSTRATES; SOLVENT MOLECULES;

CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; OPTICAL CONSTANTS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY;

THIN FILMS;

EID: 84884170425     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4819836     Document Type: Article

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