Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test

IEEE Transactions on Reliability

Volumn 64, Issue 3, 2015, Pages 960-971

  Haghighi, Firoozeh ^a   Bae, Suk Joo ^b  

^a UNIVERSITY OF TEHRAN   (Iran)

^b Hanyang University   (South Korea)

Author keywords

Accelerated degradation tests; competing risk; conditional reliability function; cumulative exposure model; step stress

Indexed keywords

FAILURE ANALYSIS; LIGHT EMITTING DIODES; MAXIMUM LIKELIHOOD; ORGANIC LIGHT EMITTING DIODES (OLED); RELIABILITY; RELIABILITY THEORY; RISK PERCEPTION; SENSITIVITY ANALYSIS; TESTING;

ACCELERATED DEGRADATION TESTS; COMPETING RISKS; CONDITIONAL RELIABILITY; CUMULATIVE EXPOSURE MODEL; STEP-STRESS;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 84940986143     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2015.2430451     Document Type: Article

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