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Journal of Statistical Planning and Inference

Volumn 136, Issue 5, 2006, Pages 1608-1620

Competing failure modes in accelerated life testing

(2) Bunea, C a Mazzuchi, T A a

a The George Washington University (United States)

Author keywords

Accelerated life testing (ALT); Bayesian inference; Competing risks; Failure rate

Indexed keywords

EID: 30944455095 PISSN: 03783758 EISSN: None Source Type: Journal
DOI: 10.1016/j.jspi.2004.10.030 Document Type: Article

Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.