Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests

IEEE Transactions on Reliability

Volumn 59, Issue 1, 2010, Pages 74-90

  Park, Jong In ^a   Bae, Suk Joo ^a  

^a Hanyang University   (South Korea)

Author keywords

Accelerated degradation test; Delta approximation; Lifetime distribution based procedure; Multiple imputation; Nonlinear random coefficients model; Organic light emitting diode

Indexed keywords

ACCELERATED DEGRADATION; ACCELERATED DEGRADATION TESTING; ACCELERATED DEGRADATION TESTS; APRIORI; DATA SETS; DEGRADATION MODEL; DIRECT PREDICTION; EXPLICIT FORM; FUNCTIONAL LINKS; LIFE-TIME DISTRIBUTION; LIFETIME DISTRIBUTION-BASED PROCEDURE; MULTIPLE IMPUTATION; PRODUCT DEGRADATION; REAL APPLICATIONS; SIMULATION RESULT; TESTING ENVIRONMENT;

DEGRADATION; DIODES; LIGHT EMISSION; LIGHT EMITTING DIODES; QUALITY ASSURANCE;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 77949262276     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2040761     Document Type: Article

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