Multiple-steps step-stress accelerated degradation modeling based on wiener and gamma processes

Communications in Statistics: Simulation and Computation

Volumn 39, Issue 7, 2010, Pages 1384-1402

  Pan, Zhengqiang ^a   Balakrishnan, N ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b MCMASTER UNIVERSITY   (Canada)

Author keywords

Bayesian MCMC method; Gamma process; Maximum likelihood estimation; Step stress accelerated degradation modeling; Wiener process

Indexed keywords

ACCELERATED DEGRADATION; BAYESIAN; GAMMA PROCESS; MCMC METHOD; STEP-STRESS; WIENER PROCESS;

BAYESIAN NETWORKS; DEGRADATION; EXPERIMENTS; MARKOV PROCESSES; RANDOM VARIABLES; SECURITY OF DATA; STRESS ANALYSIS;

MAXIMUM LIKELIHOOD ESTIMATION;

EID: 77954822524     PISSN: 03610918     EISSN: 15324141     Source Type: Journal    
DOI: 10.1080/03610918.2010.496060     Document Type: Article

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