Direct Imaging of Cl- and Cu-Induced Short-Circuit Efficiency Changes in CdTe Solar Cells

Advanced Energy Materials

Volumn 4, Issue 15, 2014, Pages

  Poplawsky, Jonathan D ^a   Paudel, Naba R ^c   Li, Chen ^a,d   Parish, Chad M ^a   Leonard, Donovan ^a   Yan, Yanfa ^c   Pennycook, Stephen J ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

^c UNIVERSITY OF TOLEDO   (United States)

^d VANDERBILT UNIVERSITY   (United States)

Author keywords

electron beam induced current; photovoltaic devices; scanning transmission electron microscopy; solar cells; thin films

Indexed keywords

CADMIUM CHLORIDE; CADMIUM TELLURIDE; COPPER; COPPER METALLOGRAPHY; DEPOSITION; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; GRAIN BOUNDARIES; HEAT TREATMENT; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; OPEN CIRCUIT VOLTAGE; SCANNING; SCANNING ELECTRON MICROSCOPY; SOLAR ABSORBERS; SOLAR CELLS; SOLAR POWER GENERATION; THIN FILM SOLAR CELLS; THIN FILMS; TIMING CIRCUITS; TRANSMISSIONS;

CARRIER COLLECTION; CARRIER COLLECTION EFFICIENCIES; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON-BEAM-INDUCED CURRENT; PHOTOVOLTAIC DEVICES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPACE CHARGE REGIONS;

CHLORINE COMPOUNDS;

EID: 84939260899     PISSN: 16146832     EISSN: 16146840     Source Type: Journal    
DOI: 10.1002/aenm.201400454     Document Type: Article

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