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Volumn 14, Issue SUPPL. 2, 2008, Pages 976-977
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Low energy Ga+ and Ar+ ion milling for improved EBSD sample preparation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 49549097619
PISSN: 14319276
EISSN: 14358115
Source Type: Journal
DOI: 10.1017/S1431927608081294 Document Type: Conference Paper |
Times cited : (13)
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References (3)
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