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Thin Solid Films

Volumn 389, Issue 1-2, 2001, Pages 75-77

Characterization of extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation

(3) Yan, Yanfa a Al Jassim, M M a Jones, K M a

a NATIONAL RENEWABLE ENERGY LABORATORY (United States)

Author keywords

Cadmium telluride (CdTe); Structure properties; Transmission electron microscopy (TEM)

Indexed keywords

DISLOCATIONS (CRYSTALS); HIGH RESOLUTION ELECTRON MICROSCOPY; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR GROWTH; STACKING FAULTS; SUBLIMATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

LAMELLAR TWINS;

SEMICONDUCTING FILMS;

EID: 0035876639 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)00841-0 Document Type: Article

Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.