Electrical characterization of Cu composition effects in CdS/CdTe thin-film solar cells with a ZnTe:Cu back contact

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue PART 2, 2012, Pages

  Li, Jian V ^a   Duenow, Joel N ^a   Kuciauskas, Darius ^a   Kanevce, Ana ^a   Dhere, Ramesh G ^a   Young, Matthew R ^a   Levi, Dean H ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

admittance measurement; capacitance voltage characteristics; CdTe; charge carrier density; contacts; defect

Indexed keywords

ADMITTANCE MEASUREMENTS; CAPACITANCE VOLTAGE CHARACTERISTIC; CDTE; DEVICE PERFORMANCE; ELECTRICAL CHARACTERIZATION; POTENTIAL BARRIERS; SATURATION CURRENT DENSITIES; THIN-FILM SOLAR CELLS;

CADMIUM TELLURIDE; CHARGE CARRIERS; CONTACTS (FLUID MECHANICS); DEFECTS; NUCLEAR PHYSICS; ZINC COMPOUNDS;

COPPER;

EID: 84891084701     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC-Vol2.2013.6656756     Document Type: Conference Paper

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