-
1
-
-
84881468603
-
-
US Patent, US Patent and Trademark Office, Washington, DC.
-
Arnold, W.H. III, Farnaam, M. and Sliwa, J. (1989), "Titanium nitride as an antireflection coating on highly reflective layers for photolithography", US Patent No. 4,820,611, US Patent and Trademark Office, Washington, DC.
-
(1989)
Titanium Nitride as an Antireflection Coating on Highly Reflective Layers for Photolithography
-
-
Arnold, W.H.1
Farnaam, M.2
Sliwa, J.3
-
2
-
-
78649510624
-
Ambient intelligence and smart environments: A state of the art
-
Springer, New York, NY
-
Augusto, J.C., Nakashima, H. and Aghajan, H. (2010), "Ambient intelligence and smart environments: A state of the art", Handbook of Ambient Intelligence and Smart Environments, Springer, New York, NY, pp. 3-31.
-
(2010)
Handbook of Ambient Intelligence and Smart Environments
, pp. 3-31
-
-
Augusto, J.C.1
Nakashima, H.2
Aghajan, H.3
-
3
-
-
84907904253
-
Novel system-in-package design and packaging solution for solid state lighting systems
-
Orlando, FL, 27-30 May, IEEE
-
Dong, M., Santagata, F., Wei, J., Yuan, C. and Zhang, G. (2014), "Novel system-in-package design and packaging solution for solid state lighting systems", Proceedings of Electronic Components and Technology Conference, Orlando, FL, 27-30 May, IEEE, pp. 1192-1197.
-
(2014)
Proceedings of Electronic Components and Technology Conference
, pp. 1192-1197
-
-
Dong, M.1
Santagata, F.2
Wei, J.3
Yuan, C.4
Zhang, G.5
-
4
-
-
49749117871
-
System-in-package technology: Opportunities and challenges
-
17-19 March, IEEE
-
Fontanelli, A. (2008), "System-in-package technology: Opportunities and challenges", Proceedings of International Symposium Quality Electronic Design, San Jose, CA, 17-19 March, IEEE, pp. 589-593.
-
(2008)
Proceedings of International Symposium Quality Electronic Design, San Jose, CA
, pp. 589-593
-
-
Fontanelli, A.1
-
5
-
-
84887071636
-
Integrated MEMS: Opportunities & challenges
-
French, P.J. and Sarro, P.M. (2010), "Integrated MEMS: Opportunities & challenges", Micromachining Techniques for Fabrication of Micro and Nano Structures, Vol. 2 No. 1, pp. 253-276.
-
(2010)
Micromachining Techniques for Fabrication of Micro and Nano Structures
, vol.2
, Issue.1
, pp. 253-276
-
-
French, P.J.1
Sarro, P.M.2
-
6
-
-
84857541945
-
Development of an intelligent integrated LED system-in-package
-
12-15 September, IEEE
-
Gielen, A.W.J., Hesen, P., Swartjes, F., Zeijl, H.V., Boschman, F., Bullema, J.E., Werkhoven, R.J. and Koh, S. (2011), "Development of an intelligent integrated LED system-in-package", Proceedings of European Microelectronics and Packaging Conference, Brighton, 12-15 September, IEEE, pp. 1-7.
-
(2011)
Proceedings of European Microelectronics and Packaging Conference, Brighton
, pp. 1-7
-
-
Gielen, A.W.J.1
Hesen, P.2
Swartjes, F.3
Zeijl, H.V.4
Boschman, F.5
Bullema, J.E.6
Werkhoven, R.J.7
Koh, S.8
-
7
-
-
51349137210
-
3D silicon integration
-
27-30 May, IEEE
-
Knickerbocker, J.U., Andry, P.S., Dang, B., Horton, R.R., Patel, C.S., Polastre, R.J., Sakuma, K., Sprogis, E.S., Tsang, C.K., Webb, B.C. and Wright, S.L. (2008), "3D silicon integration", Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, FL, 27-30 May, IEEE, pp. 538-543.
-
(2008)
Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, FL
, pp. 538-543
-
-
Knickerbocker, J.U.1
Andry, P.S.2
Dang, B.3
Horton, R.R.4
Patel, C.S.5
Polastre, R.J.6
Sakuma, K.7
Sprogis, E.S.8
Tsang, C.K.9
Webb, B.C.10
Wright, S.L.11
-
8
-
-
24644495782
-
Three-dimensional system-in-package using stacked silicon platform technology
-
Kripesh, V., Yoon, S.W., Ganesh, V.P., Khan, N., Rotaru, M.D., Fang, W. and Iyer, M.K. (2005), "Three-dimensional system-in-package using stacked silicon platform technology", IEEE Transactions on Advanced Packaging, Vol. 28 No. 3, pp. 377-386.
-
(2005)
IEEE Transactions on Advanced Packaging
, vol.28
, Issue.3
, pp. 377-386
-
-
Kripesh, V.1
Yoon, S.W.2
Ganesh, V.P.3
Khan, N.4
Rotaru, M.D.5
Fang, W.6
Iyer, M.K.7
-
9
-
-
79956077641
-
Overview and outlook of through-silicon via (TSV) and 3D integrations
-
Lau, J.H. (2011), "Overview and outlook of through-silicon via (TSV) and 3D integrations", Microelectronics International, Vol. 28 No. 2, pp. 8-22.
-
(2011)
Microelectronics International
, vol.28
, Issue.2
, pp. 8-22
-
-
Lau, J.H.1
-
10
-
-
77952599293
-
3D LED and IC wafer level packaging
-
Lau, J., Lee, R., Yuen, M. and Chan, P. (2010), "3D LED and IC wafer level packaging", Microelectronics International, Vol. 27 No. 2, pp. 98-105.
-
(2010)
Microelectronics International
, vol.27
, Issue.2
, pp. 98-105
-
-
Lau, J.1
Lee, R.2
Yuen, M.3
Chan, P.4
-
11
-
-
70349661398
-
3D image sensor SiP with TSV silicon interposer
-
26-29 May, IEEE
-
Limansyah, I., Wolf, M.J., Klumpp, A., Zoschke, K., Wieland, R., Klein, M., Oppermann, H., Nebrich, L., Heinig, A., Pechlaner, A., Reichl, H. and Weber, W. (2011), "3D image sensor SiP with TSV silicon interposer", Proceedings of Electronic Components and Technology Conference, San Diego, CA, 26-29 May, IEEE, pp. 1430-1436.
-
(2011)
Proceedings of Electronic Components and Technology Conference, San Diego, CA
, pp. 1430-1436
-
-
Limansyah, I.1
Wolf, M.J.2
Klumpp, A.3
Zoschke, K.4
Wieland, R.5
Klein, M.6
Oppermann, H.7
Nebrich, L.8
Heinig, A.9
Pechlaner, A.10
Reichl, H.11
Weber, W.12
-
12
-
-
0033222020
-
Copper metallization reliability
-
Lloyd, J.R., Clemens, J. and Snede, R. (1999), "Copper metallization reliability", Microelectronics Reliability, Vol. 39 No. 11, pp. 1595-1602.
-
(1999)
Microelectronics Reliability
, vol.39
, Issue.11
, pp. 1595-1602
-
-
Lloyd, J.R.1
Clemens, J.2
Snede, R.3
-
13
-
-
0034483014
-
Silicon interposer technology for high-density package
-
21-24 May, IEEE
-
Matsuo, M., Hayasaka, N., Okumura, K., Hosomi, E. and Takubo, C. (2000), "Silicon interposer technology for high-density package", Proceedings of Electronic Components and Technology Conference, Las Vegas, NV, 21-24 May, IEEE, pp. 1455-1459.
-
(2000)
Proceedings of Electronic Components and Technology Conference, Las Vegas, NV
, pp. 1455-1459
-
-
Matsuo, M.1
Hayasaka, N.2
Okumura, K.3
Hosomi, E.4
Takubo, C.5
-
14
-
-
34948874050
-
Challenges and opportunities in system-in-package (SiP) business
-
26-28 August, IEEE
-
Sham, M.L., Chen, Y.C., Leung, L.W., Lin, J.R. and Chung, T. (2006), "Challenges and opportunities in system-in-package (SiP) business", Proceedings of International. Conference on Electronic Packaging Technology, Shanghai, 26-28 August, IEEE, pp. 1-5.
-
(2006)
Proceedings of International. Conference on Electronic Packaging Technology, Shanghai
, pp. 1-5
-
-
Sham, M.L.1
Chen, Y.C.2
Leung, L.W.3
Lin, J.R.4
Chung, T.5
-
15
-
-
84884691158
-
System-In-Package (SIP): Challenges and opportunities
-
25-28 January, ACM, New York, NY
-
Tai, K.L. (2000), "System-In-Package (SIP): Challenges and opportunities", Proceedings of the 2000 Asia and South Pacific Design Automation Conference, Yokohama, 25-28 January, ACM, New York, NY, pp. 191-196.
-
(2000)
Proceedings of the 2000 Asia and South Pacific Design Automation Conference, Yokohama
, pp. 191-196
-
-
Tai, K.L.1
-
17
-
-
33747625440
-
Silicon-based packaging platform for light-emitting diode
-
Tsou, C. and Huang, Y. (2006), "Silicon-based packaging platform for light-emitting diode", IEEE Transactions on Advanced Packaging, Vol. 29 No. 3, pp. 607-614.
-
(2006)
IEEE Transactions on Advanced Packaging
, vol.29
, Issue.3
, pp. 607-614
-
-
Tsou, C.1
Huang, Y.2
-
18
-
-
79960384145
-
Silicon-based wafer-level packaging for cost reduction of high brightness LEDs
-
31 May-3 June, IEEE
-
Uhrmann, T., Matthias, T. and Lindner, P. (2011), "Silicon-based wafer-level packaging for cost reduction of high brightness LEDs", Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, FL, 31 May-3 June, IEEE, pp. 1622-1625.
-
(2011)
Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, FL
, pp. 1622-1625
-
-
Uhrmann, T.1
Matthias, T.2
Lindner, P.3
-
19
-
-
23744498787
-
Flexible electronics: Silicon meets paper and beyond
-
Whitmarsh, J. (2005), "Flexible electronics: silicon meets paper and beyond", Microelectronics International, Vol. 22 No. 3, pp. 16-19.
-
(2005)
Microelectronics International
, vol.22
, Issue.3
, pp. 16-19
-
-
Whitmarsh, J.1
-
20
-
-
77950961965
-
3D integration of image sensor SiP using TSV silicon interposer
-
9-11 December, IEEE, New York, NY
-
Wolf, M.J., Zoschke, K., Klumpp, A., Wieland, R., Klein, M., Nebrich, L., Heinig, A., Limansyah, I., Weber, W., Ehrmann, O. and Reich, H. (2009), "3D integration of image sensor SiP using TSV silicon interposer", Proceedings of Electronics Packaging Technology Conference, 9-11 December, IEEE, New York, NY, pp. 795-800.
-
(2009)
Proceedings of Electronics Packaging Technology Conference
, pp. 795-800
-
-
Wolf, M.J.1
Zoschke, K.2
Klumpp, A.3
Wieland, R.4
Klein, M.5
Nebrich, L.6
Heinig, A.7
Limansyah, I.8
Weber, W.9
Ehrmann, O.10
Reich, H.11
-
21
-
-
79960420838
-
TSV based silicon interposer technology for wafer level fabrication of 3D SiP modules
-
31 May-3 June, IEEE
-
Zoschke, K., Wolf, J., Lopper, C., Kuna, I., Jürgensen, N., Glaw, V., Samulewicz, K., Röder, J., Wilke, M., Wünsch, O., Klein, M., Suchodoletz, M.V., Oppermann, H., Braun, T., Wieland, R. and Ehrmann, O. (2011), "TSV based silicon interposer technology for wafer level fabrication of 3D SiP modules", Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, FL, 31 May-3 June, IEEE, pp. 836-843.
-
(2011)
Proceedings of Electronic Components and Technology Conference, Lake Buena Vista, FL
, pp. 836-843
-
-
Zoschke, K.1
Wolf, J.2
Lopper, C.3
Kuna, I.4
Jürgensen, N.5
Glaw, V.6
Samulewicz, K.7
Röder, J.8
Wilke, M.9
Wünsch, O.10
Klein, M.11
Suchodoletz, M.V.12
Oppermann, H.13
Braun, T.14
Wieland, R.15
Ehrmann, O.16
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