Characterization of a-Si:H thin layers incorporated into textured a-Si:H/c-Si solar cell structures by spectroscopic ellipsometry using a tilt-angle optical configuration

Thin Solid Films

Volumn 569, Issue C, 2014, Pages 64-69

  Tanaka, Yoshikazu ^a   Matsuki, Nobuyuki ^a   Fujiwara, Hiroyuki ^a  

^a GIFU UNIVERSITY   (Japan)

Author keywords

A Si:H; Solar cell; Spectroscopic ellipsometry; Textured structure; Tilt angle configuration

Indexed keywords

AMORPHOUS SILICON; ELLIPSOMETRY; GROWTH RATE; LIGHT SOURCES; SILICON; SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; TEXTURES;

A-SI:H; CRYSTALLINE SILICONS; DIELECTRIC FUNCTIONS; HYDROGENATED AMORPHOUS SILICON (A-SI:H); OPTICAL CONFIGURATIONS; SOLAR CELL STRUCTURES; TEXTURED SUBSTRATES; TILT ANGLE;

SILICON SOLAR CELLS;

EID: 84927750982     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2014.08.039     Document Type: Article

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