Influence of textured c-Si surface morphology on the interfacial properties of heterojunction silicon solar cells

Journal of Non-Crystalline Solids

Volumn 358, Issue 17, 2012, Pages 2223-2226

  Li, Guorong ^a   Zhou, Yuqin ^a   Liu, Fengzhen ^a  

^a UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

HIT solar cells; HWCVD; Interfacial property; Passivation; Textured surface

Indexed keywords

A-SI:H; C-SI SUBSTRATES; HWCVD; I-V MEASUREMENTS; INTERFACIAL PROPERTY; MINORITY CARRIER LIFETIMES; ON-WAFER; SURFACE PASSIVATION; TEXTURED SURFACE; THIN LAYERS;

EPITAXIAL GROWTH; HETEROJUNCTIONS; PASSIVATION; SILICON; SILICON SOLAR CELLS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS;

SILICON WAFERS;

EID: 84865783447     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2011.12.106     Document Type: Conference Paper

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