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Volumn 22, Issue 2, 2015, Pages 336-341

Pushing the limits: An instrument for hard X-ray imaging below 20nm

Author keywords

interferometry; multilayer Laue lenses; nanopositioning Includes papers presented at the 8th International Workshop on X ray Radiation Damage to Biological Crystalline Samples; scanning X ray microscopy

Indexed keywords

INTERFEROMETRY; MULTILAYERS; NANOCRYSTALLINE MATERIALS; RADIATION DAMAGE; X RAY MICROSCOPES;

EID: 84924229995     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514025715     Document Type: Conference Paper
Times cited : (68)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.